Beamline 24-ID-E: Sector 24 - Insertion Device

Description

Sector 24 utilizes canted insertion devices to provide two independent x-ray sources, one for a variable energy beamline 24-ID-C (6-20 keV) and another for a fixed energy beamline 24-ID-E (Se peak). Both beamlines are optimized to address challenging cases in macromolecular crystallography such as large complex molecular assemblies, poorly diffracting crystals and microcrystals by providing extremely stable and intense x-ray beams with beam sizes ranging from 5 to 10 microns. The 24-ID-C beamline is equipped with an ALS-style sample auto-mount robotic system for increased productivity and a mini-kappa goniometer head for crystal alignment. Remote operations available.

Supported Techniques

• Macromolecular crystallography
• Microbeam
• Microdiffraction
• Single-wavelength anomalous dispersion
• Single-crystal diffraction

Beamline Controls and Data Acquisition

Data acquisition and beamline controls via CONSOLE and EPICS, RAPD and 1.35 PetaByte data storage system

Detectors

• Eiger 16M
• AMPTEK XR-100SDD

Additional Equipment

• ACCEL/Maatel MD2 Microdiffractometer
• LR-Design detector positioner
• Oxford Cryojet sample cooler
• Fully equiped chemistry laboratory

Local Contacts

Beamline Specs

For additional information see:
https://necat.chem.cornell.edu

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