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Beamline 26-ID-C: Hard X-ray Nanoprobe
CNM/XSD
Physics, Materials Science
Description
The Nanoprobe beamline program is devoted to multimodal chemical and structural nano-imaging by scanning fluorescence, diffraction and Bragg ptychography methods using 7-12 keV X-rays, with special emphasis on nanoscience.
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Supported Techniques
- Ptychography
- Nanodiffraction
- Coherent x-ray scattering
- X-ray fluorescence microscopy (XFM)
Beamline Controls and Data Acquisition
Beamline operation: EPICS.
Nanoprobe instrument: EPICS, Python, Matlab
Detectors
- SII Vortex-ME4: SDD EDS (4-elements)
- SII Vortex SDD EDS (single element)
- Eiger2 X 1M
- ASC Medipix 3 PAD
- PI Isoplane optical spectrometer
Additional Equipment
- http://www.anl.gov/cnm/group/electron-x-ray-microscopy
- https://wiki.anl.gov/cnm/Nanoprobe_Scanning_Quick_Reference
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Local Contacts
Beamline Specs
Source |
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Monochromator Type |
DCM, Si(111) |
Energy Range |
7-12 keV |
Resolution (ΔE/E) |
1.3 x 10 -4 |
Flux (photons/sec) |
1 x 10 9 @10 keV |
Beam Size (HxV) |
Focused |
.02µm x .02µm
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Unfocused |
.5mm x .5mm
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For additional information see:
https://www.anl.gov/cnm/xray-ptychography-and-microscopy
Current Status:
Operational
Access Mode:
On-site
Remote
Mail-in
Observer
Beamline Staff
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Selected Publications
S.O. Hruszkewycz et al., "High resolution three dimensional structural microscopy by single angle Bragg ptychography," Nature Mater. 16, 244 (2017).
Y. Luo et al., "Spatially heterogeneous chlorine ... in perovskite solar cells," Chem. Mater. 28, 6536 (2016).
Q. Hu et al., "Direct measurements of 3d structure, ... during C3s hydration," Cement Concrete Res. 89, 14 (2016).
Y. Kashiv et al., "Imaging trace element distributions in single organelles ...," Sci. Rep. 6, 21437 (2016).
M. Stuckelberger et al., "Latest developments in the x-ray based characterization of thin-film solar cells", Proc. IEEE 42nd PVSC, p. 1 (2015).
N. Shirato et al., "Elemental fingerprinting of materials with sensitivity at the atomic limit," Nano Lett. 14, 6499 (2014).
T.T.A. Lummen et al., "Thermotropic phase boundaries in classic ferroelectrics," Nature Comm. 5, 3172 (2014).
M.V. Holt et al., "Strain imaging of nanoscale semiconductor heterostructures ...," Phys. Rev. Lett. 112, 165502 (2014).
M. Holt et al., "Nanoscale hard x-ray microscopy methods for materials studies," Ann. Rev. Mater. Res. 43, 183 (2013).
G. Gopalakrishnan et al., "Thermal diffuse scattering as a probe of large-wave-vector phonons ...," Phys. Rev. Lett. 110, 205503 (2013).
S. Hruszkewycz et al., "Imaging local polarization in ferroelectric thin films ...," Phys. Rev. Lett. 110, 177601 (2013).
H. Yan et al., "Quantitative x-ray phase imaging at the nanoscale by multilayer Laue lenses," Sci. Reports 3, 1307 (2013).
J.L. Provis et al., "Nanostructural characterization of geopolymers ...," Cement and Concrete Composites 36, 56 (2013).
S. Hruszkewycz et al., "Quantitative imaging of lattice distortions in epitaxial semiconductor heterostructures ...," Nano Lett. 12, 5148 (2012).
Beamline:
R. Winarski et al., "A hard x-ray nanoprobe beamline for nanoscale microscopy," J. Synchr. Rad. 19, 1056 (2012).
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