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Beamline 1-ID-B,C,E: High-energy X-ray Scattering
X-ray Science Division, APS
Materials Science, Physics, Chemistry, Life Sciences
Description
1-ID is a dedicated high-energy x-ray scattering beamline operating in the 42-130 keV range. The x-ray optics are optimized for high-energy x-ray usage and high-energy resolution, and several focusing modes are available. Supported high-energy techniques include macroscopic stress/texture determination, single-grain diffraction microscopy (HEDM), pair-distribution function measurements, powder diffraction, and small-angle scattering. Support for various in-situ environments is available including thermo-mechanical deformation. A conical slit for 3D mapping is available in 1-ID-C.
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Supported Techniques
- High-energy x-ray diffraction
- Tomography
- Small-angle x-ray scattering
- Fluorescence spectroscopy
- Pair distribution function
- Phase contrast imaging
Beamline Controls and Data Acquisition
The beamline is run by Linux workstations and VME-based electronics. The VME-based equipment is controlled by EPICS. There are several software clients that use EPICS including MEDM, Python/Bluesky and SPEC. Other computers, such as PCs, are used to run specialized pieces of equipment (e.g., area detectors). FPGAs and associated code (SoftGlue) used for detector-motion synchronization in high-demand applications.
Detectors
- 5x GE-41RT area detector
- Ge & Si solid state detectors
- Pixirad 3 CdTe area detector
- 2x PointGrey CCD + scintillators
- Dexela 2923 area detector
- Varex 4343 area detector
- Pilatus2M-CdTe (detector pool- needs request)
Additional Equipment
- 4-circle diffractometer
- Conical and spiral slits
- Multi-DOF sample-manipulation systems
- MTS servo-hydraulic 15kN load frame
- RI Infrared furnace
- Linkam TS1500 furnace
- RF furnace
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Local Contacts
Beamline Specs
Source |
Undulator 2.3cm - 2.4m or 2.1m length |
Monochromator Type |
Si(111) Bent Double-Laue |
Energy Range |
42-136 keV |
Resolution (ΔE/E) |
1.3 x 10 -3 |
Flux (photons/sec) |
6 x 10 12 @80 keV |
Beam Size (HxV) |
Focused |
1µm x 1µm
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Unfocused |
1.5mm x 1mm
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Monochromator Type |
High-resolution Mono |
Energy Range |
42-116 keV |
Resolution (ΔE/E) |
1 x 10 -4 |
Flux (photons/sec) |
2 x 10 11 @80 keV |
Beam Size (HxV) |
Focused |
1µm x 1µm
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Unfocused |
1.5mm x 1mm
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For additional information see:
https://www.aps.anl.gov/Sector-1/1-ID
Current Status:
Operational/Accepting General Users
Access Mode:
On-site
Remote
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Selected Publications
"Universal mechanism of thermomechanical deformation in metallic glasses,"
W. Dmowski, Y. Tong, T. Iwashita, Y. Yokoyama, T. Egami, Phys. Rev. B 91, 060101 (2015).
"Bone cell-independent benefits of raloxifene on the skeleton: A novel mechanism for improving bone material properties," Maxime A. Gallant, Drew M. Brown, Max Hammond, Joseph M. Wallace, Jiang Du, Alix C. Deymier-Black, Jonathan D. Almer, Stuart R. Stock, Matthew R. Allen, David B. Burr, Bone 61, 191 (2014).
"Strain response of thermal barrier coatings captured under extreme engine environments through synchrotron X-ray diffraction,"
Kevin Knipe, Albert Manero, II, Sanna F. Siddiqui, Carla Meid, Janine Wischek, John Okasinski, Jonathan Almer, Anette M. Karlsson, Marion Bartsch, Seetha Raghavan, Nature Communications 5, 4559 (2014).
Shui, J.-L.; Okasinski, J. S.; Kenesei, P.; Dobbs, H. A.; Zhao, D.; Almer, J. D.; Liu, D.-J., Reversibility of anodic lithium in rechargeable lithium-oxygen batteries. Nature Communications 2013
Sun, Y.; Ren, Y.; Haeffner, D. R.; Almer, J. D.; Wang, L.; Yang, W.; Truong, T. T., Nanophase Evolution at Semiconductor/Electrolyte Interface in Situ Probed by Time-Resolved High-Energy Synchrotron X-ray Diffraction. Nano Letters 2010, 10 (9), 3747-3753.
Leemreize, H.; Almer, J.; Stock, S.; Birkedal, H., Three-dimensional distribution of polymorphs and magnesium in a calcified underwater attachment system by diffraction tomography. Journal of the Royal Society Interface 2013, 10 (86).
Cheng, S.; Lee, S.; Li, L.; Lei, C.; Almer, J.; Wang, X.; Ungar, T.; Wang, Y.; Liaw, P., Uncommon Deformation Mechanisms during Fatigue-Crack Propagation in Nanocrystalline Alloys. Physical Review Letters 2013, 110 (13).
H.W. Sheng, H.Z. Liu, Y.Q. Cheng, J. Wen, P.L. Lee, W.K. Luo, S.D. Shastri, E. Ma, "Polyamorphism in a metallic glass," Nat. Mater. 6 (3), March, 192-197 (2007). DOI: 10.1038/nmat1839
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