Current Status:
Operational/Accepting General Users

Local Contacts:
· JOHN QUINTANA - ph: 630.252.3305 ; email: jpq@anl.gov
· S. DIANE SANDBERG - ph: No Phone# Available ; email: d-sandberg@northwestern.edu
· DENIS T KEANE - ph: 630.252.0224 ; email: dtkeane@northwestern.edu


Supported Techniques
· X-ray absorption fine structure (XAFS)
· Polymer
· High energy x-ray scattering


Discipline: Material Science , Polymer Science

Source: Bending Magnet

Beamline Specs:
Energy Range Monochromator Type Resolution Flux Beam Size
(horiz x vert)
        Unfocused Focused
4.5-25 keV Si 111 1 x 10 -4   30mm x .5mm  
4.5-80 keV Si 111 1 x 10 -4   30mm x 5mm  


Beamline Controls and Data Acquisition:
    Linux running custom control code for motors and actuators on all systems
SPEC used to control diffractometers and surface-science instruments
Vendor-supplied software used to control CCD detectors

Detectors:
· spectroscopy-grade ionization chambers
· Lytle detector
· Fuji BAS 2000 image-plate system
· scintillation detectors
· Mar 165 mm CCD detector
· EG&G Ortec Iglet solid-state detector
· Canberra 13-element SSD
· Microphotonics 2-D detector
· Bent Laue analyzers


Additional Equipment:
· 4-Circle diffractometer
· Capillary Lens
· Outside Air Exhaust


Operator: DND-CAT
Additional Information (Beamline URL)

All Publications for 05-BM

Last Updated on 05/27/2004
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